Discussion
Automatic defect detection in tomographic volumes using artificial intelligence approaches

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SF1500 V1 Article

Discussion
Automatic defect detection in tomographic volumes using artificial intelligence approaches

Authors : Valérie KAFTANDJIAN, Abdel Rahman DAKAK, Philippe DUVAUCHELLE

Review date: July 2, 2025 | Lire en français

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7. Discussion

In the proposed global approach, indications are first detected, then classified, and their characterization (not detailed here) is done last to finally accept or reject the part according to industrial specifications. Other approaches, known as "machine learning", are also considered to be part of the Artificial Intelligence family and deserve to be discussed. In these methods, discontinuities are segmented, then their features are calculated for use as input to a classifier. For example, Zhao et al

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