Techniques
TOF-SIMS mass spectrometry imaging for the analysis of ancient paintings

Add to my library

RE274 V1 Research and innovation

Techniques
TOF-SIMS mass spectrometry imaging for the analysis of ancient paintings

Author : Alain BRUNELLE

Publication date: January 10, 2019 | Lire en français

Add to my library Add to my library

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

1. Techniques

1.1 TOF-SIMS

There are numerous elemental analysis techniques that can be used to study and characterize the chemical composition of heritage samples. Among these, X-ray fluorescence, Fourier transform infrared spectroscopy, Raman spectroscopy and particle-induced X-ray emission are established and widely used methods (see [RE 200] ,

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?

Article included in this offer

"Technological innovations"

( 196 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details
Contact us
Contact our team FAQ