3. Preparing samples for individual orientation measurements
The first requirement for electron microscopy is to have samples that are stable in a vacuum and under the impact of high-energy electrons. They must possess a minimum of electrical conductivity so as not to become charged . In the case of TEM, the electrical charge is less critical and can be reduced by placing a thin sample on a conductive support film. Secondary electrons released by a large-aperture diaphragm in the back focal plane will...
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Preparing samples for individual orientation measurements
Conclusion
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