Interactions between organic matter and electron beams
Characterization of polymers by electron microscopy

The two main types of microscope discussed here are the transmission electron microscope (TEM) and the scanning electron microscope (SEM).

In theMET , the image is formed by interactions between the sample and a large beam of electrons passing through it (figure 1 a ). It is then magnified by a system of electromagnetic lenses. Maximum separating power is of the order of 0.2 to 0.3 nm for modern medium-voltage TEMs (200 to 400 kV). Some TEMs also operate in scanning electron transmission microscopy (STEM) mode, with a very fine probe, which is useful, for example, if you want to combine morphology with spectroscopic analysis of the X-rays (RX) emitted during irradiation.