4. Application of diffraction
Electron microscopy enables a variety of diffraction modes, not forgetting reflection and backscatter diffraction patterns. These techniques will be discussed in a future issue.
These include area-selective diffraction, microdiffraction and convergent beam techniques (the incident beam has a large aperture, whereas in the previous methods, the incident beam is almost parallel, i.e. hardly convergent).
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The convergent beam method highlights Laue zones, i.e. several successive planes of the reciprocal lattice, providing important information on lattice symmetries and type.
The simulation in figure
20
, carried out with JEMS, shows the three Laue zones,...
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Application of diffraction