Intermittent microscopy (TM)
Polymer surface imaging: atomic force microscopy

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AM3280 V1 Article

Intermittent microscopy (TM)
Polymer surface imaging: atomic force microscopy

Author : Ghislaine COULON

Publication date: January 10, 2000 | Lire en français

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5. Intermittent microscopy (TM)

In the field of polymers, the advent in 1995 of the TM intermittent mode microscope (or TappingTM mode) has significantly increased the resolution of surface images of non-model polymers (with, for example, high surface roughness).

An oscillation of high frequency (300 kHz), close to the spring resonance frequency (high stiffness: k = 10 -40 N/m; quality factor Q = 100 to 1,000) and variable amplitude (Ai = 10 to 100 nm), is imposed on the spring [13]. Initially, the tip is far from the surface and the spring oscillates freely (amplitude A0). Then, when the surface is brought closer to the polymer, the tip, for each low position, comes to tap the surface intermittently (figure 10); due to the tip-surface...

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