4. Characterization of defects
Channelling is achieved for a family of hkl planes when the untilted incident beam falls on the edge of the band (hkl), ideally for s > 0 and far from the intersection of another band edge so that only one diffraction condition is satisfied
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Characterization of defects
Bibliography
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(1) - COATES (D.G.) -
Kikuchi-like reflection patterns obtained with the scanning electron microscope.
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Phil. Mag., 16, p. 1179-1184 (1967).
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(2) - BOOKER (G.R.), SHAW (A.M.B), WHELAN (M.J.), HIRSCH (P.B.) -
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