3. Specific issues in trace analysis
Localized analysis of an element and its distribution on the surface of a material is becoming increasingly popular in all fields. This type of analysis (figure
1
) requires an elemental trace analysis, since depending on the size of the measuring pixel (2D), the element content to be measured can be extremely low. Most of the multi-element techniques mentioned above enable imaging analysis, to which surface analysis techniques can be added. Several fields of application are driving analytical developments...
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Specific issues in trace analysis