Measurement and instrumentation
Large signal S parameters for nonlinear device characterisation

The development of automated vector network analyzers and appropriate calibration techniques, and the ability to extract S-parameters from electrical circuit models for simulation, have enabled S-parameters to establish themselves as a measurable and usable quantity, essential for the design and construction of radio-frequency components, circuits and systems. The same advantage can be obtained for their extension to the non-linear domain if the same approach,...