Multi-element analysis
Charged particle-induced X-ray emission (PIXE): applications

The nature and energy of the particles delivered by the gas pedal will be chosen according to the elements to be analyzed (see article . The ions most often used for PIXE analysis are H ⁺ protons, whose ionization cross-section in the few MeV range is, for most elements, greater than that of heavier particles. Ion energies can be selected to analyze as many elements as possible. The K lines of light atoms (11 < Z < 20) can be excited using protons with energies between 1 and 2 MeV, whereas heavier elements (20 < Z < 92) require particles with energies above 2 MeV. The variation in beam energy can also be used to probe different thicknesses of material to obtain a concentration...