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INTRODUCTION
Non-destructive X-ray diffraction analysis of crystallized samples is a powerful method for solving many industrial and technological problems. Initially, this technique was mainly used to determine crystal structures from single-crystal samples. Subsequently, other applications involving the characterization of polycrystalline materials were developed.
Among the instruments currently in use, the powder diffractometer is certainly the most common in industrial and university laboratories.
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X-ray diffraction characterization of crystallized solids