5. Measuring surface contamination
In the vacuum system, there are two types of contamination, depending on requirements:
contamination by the gaseous atmosphere, which is accessible through residual gas analysis;
surface contamination caused by physico-chemical treatments, which can be accessed using surface analysis techniques (Auger spectroscopy, S.E.M. Scanning Electron Microscope - X.P.S. Xray Photoelectron Spectroscopy); all these techniques can be used to measure the cleanliness of an enclosure
You do not have access to this resource.
Exclusive to subscribers. 97% yet to be discovered!
Already subscribed?
Log in!
Ongoing reading
Measuring surface contamination