2. Applications
The ability to study surfaces with extreme resolution using atomic force microscopy techniques has led to the emergence of a wealth of related techniques using locally interacting probes. The world of local detection techniques and AFM-type microscopy is described in figure
18
.
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Applications
Bibliography
References
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(1) - BINNING (G.), QUATE (C.F.), GERBER (C.) -
Atomic force microscope.
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Phys. Rev. Lett., 56, 930-933 (1986).
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(2) - MEYER (G.), AMER (N.) -
« Novel approach to atomic force microscopy ».
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Appl. Phys. Lett., 53 (24),...
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