Conclusion
Mapping and controlling ferroelectricity at the nanoscale

The Piezoresponse Force Microscopy mode of atomic force microscopy remains a formidable tool for detecting and monitoring ferroelectric polarization. As with any measurement obtained by a complex instrument, the artifacts that can alter interpretation must be kept in mind to avoid over-interpretation. Nonetheless, PFM is probably the fastest and most spatially resolved way of obtaining polarization maps, compared with the other techniques discussed in this article. The various developments in modes associated with atomic force microscopy, such as the possibility of measuring local currents (ConductiveAFM mode), or those that make it possible to record a resonance curve or hysteresis loop in each image pixel, make it all the more valuable as it can be easily coupled with mechanical or electrical measurements that will complete the description of the material with the same spatial resolution....