Sample preparation
Characterization of polycrystalline materials by X-Ray Diffraction

Before moving on to the section on data processing, it is necessary to review the quality of the measurements. In a diffractogram, three parameters are used to describe the diffraction peaks:

• the position;

• intensity;

• the profile of the ridge (width, shape, and asymmetry).

It is therefore important to avoid any errors that could affect these factors, even though it is sometimes possible to make corrections after the measurement using analysis software.