4. Developments in scanning electron microscopy
Since the 2000s, steady progress has been made in the design and manufacture of scanning electron microscopes:
-
to improve spatial resolution:
by reducing electronic lens aberrations,
by improving detector performance,
by improving the brilliance of electron guns;
to adapt its use to the electronic components industry and to a multitude of accessories that connect to the SEM: appropriate "object" chambers equipped with many input ports;
for optimizing low and extra-low voltage operation;
to facilitate management through computerization;
to integrate the digitization of acquired images right from...
You do not have access to this resource.
Exclusive to subscribers. 97% yet to be discovered!
Already subscribed?
Log in!
Ongoing reading
Developments in scanning electron microscopy