3. Atomic force microscope and force microscopies
The Atomic Force Microscope (AFM) was born in 1986 from the need to image all types of samples, not just conductors and semi-conductors, by probing forces between tip and surface . By measuring and controlling these forces, a suitable microscope should be able to image surface topography and also to study other physical phenomena on the nanometric scale. The AFM, based on this objective, borrows from STM technology the system of nanometric displacements and regulation of relative tip-surface distance at constant force (in place of current for the STM). The setpoint is the force...
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Atomic force microscope and force microscopies
Near-field optical microscope
Bibliography
Bibliography
Directory
Manufacturers – Suppliers – Distributors (non-exhaustive list)
Calculate the stiffness of a lever: https://sadermethod.org/
From the same authors:
BUY an AFM – Photoniques 90 (2018). A list of microscope manufacturers and tip manufacturers/distributors is available.
Documentation –...
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