Topography
Surface finishes - Measurement
Article REF: R1231 V1
Topography
Surface finishes - Measurement

Author : Bernard RAPHET

Publication date: June 10, 2006 | Lire en français

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4. Topography

4.1 Introduction

Characterizing the state of a surface cannot be limited to analyzing a trajectory. The aim is to characterize the entire surface or portion of a surface, in order to determine its relief, texture and surface defects. Technological advances are constantly pushing back the frontiers of surface state knowledge and measurement. Recent years have seen a major development in equipment designed to quantify surface topography, thanks to the evolution :

  • contact measuring devices (addition of a third measuring axis);

  • high-resolution microscopy;

  • information processing and image processing.

The three-dimensional measurement of surface...

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