The basics
Charged particle-induced X-ray emission (PIXE): theory
Article REF: P2557 V1
The basics
Charged particle-induced X-ray emission (PIXE): theory

Authors : Philippe MORETTO, Lucile BECK

Publication date: December 10, 2003 | Lire en français

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1. The basics

The PIXE method is one of a number of analytical techniques that can be grouped together under the generic term of X-ray fluorescence emission techniques. They are all based on the excitation of the electronic pattern by ionization of the deeper atomic layers (K, L or M), with de-excitation subsequently producing the emission of characteristic X-rays. The excitation probe can be electrons (EDAX), X-ray photons from generators (XRF) or synchrotron radiation (SXRF), or γ-photons from radioactive sources.

In the following paragraphs, we recall a few basic concepts that will enable you to approach this technique in a practical way and, above all, to understand its specific features. For further details, please refer to the following basic references

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