Principle of secondary ion emission
Secondary ion emission SIMS - Principles and equipment
Article REF: P2618 V1
Principle of secondary ion emission
Secondary ion emission SIMS - Principles and equipment

Authors : Évelyne DARQUE-CERETTI, Henri-Noël MIGEON, Marc AUCOUTURIER

Publication date: December 10, 1998

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

1. Principle of secondary ion emission

The process of collision cascades leading to ion sputtering is described in Sigmund's model , developed for atomic, elementary and isotropic solids. Part of the energy deposited in the solid is reflected back to the surface via the recoil atoms (target atoms set in motion either by direct collision with the incident particles, or via cascade collisions). If the energy of the latter in the vicinity of the surface is greater than the binding energy of the atoms on the solid surface, they can cause the emission of surface atoms into the vacuum. The rest of the energy deposited by the primary...

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Article included in this offer

"Analysis and Characterization"

( 256 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details