Article | REF: P900 V2

Atom probe tomography APT

Authors: Didier BLAVETTE, François VURPILLOT, Bernard DECONIHOUT

Publication date: December 10, 2013 | Lire en français

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!

Automatically translated using artificial intelligence technology (Note that only the original version is binding) > find out more.

A | A

6. Measuring a composition

6.1 Quantitativity

One of the strengths of atomic probes is their quantitative nature. Unlike many other microanalysis methods (such as SIMS, Secondary Ion Mass Spectrometry), no calibration or ionization yield is involved in calculating compositions. Unlike most chemical analysis techniques, composition measurement is very direct. The number of ions collected from each species (N _A , N _B ) is proportional to the atomic fractions (A, B):

X_{B} = N_{B} / (N_{A} + N_{B})

You do not have access to this resource.

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!

The Ultimate Scientific and Technical Reference

A Comprehensive Knowledge Base, with over 1,200 authors and 100 scientific advisors

+ More than 10,000 articles and 1,000 how-to sheets, over 800 new or updated articles every year

From design to prototyping, right through to industrialization, the reference for securing the development of your industrial projects

This article is included in

Mechanical and dimensional measurements

This offer includes:

Knowledge Base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

Practical Path

Operational and didactic, to guarantee the acquisition of transversal skills

Doc & Quiz

Interactive articles with quizzes, for constructive reading

Subscribe now!

Ongoing reading
Measuring a composition

Previous
page Spatial resolution

Three-dimensional imaging in SAT

Bibliography

(1) - BRANDON (D.G.) - On field evaporation. - Philosophical Magazine, 14, p. 803-820 (1966).
(2) - TSONG (T.T.) - Field ion image formation. - Surface Science, 70, p. 211-233 (1978).
(3)...

Patents

Atomic Tomographic Wide Angle Laser Probe with very high mass resolution, BOSTEL Alain , DECONIHOUT Bernard , YAVOR Mickael , RENAUD ludovic, Date de dépôt 12/10/2007 Numero INIST 07 07178

Wide Angle Atomic Tomographic Probe with evaporation assisted by a "white" femtosecond laser pulse, DECONIHOUT Bernard, VELLA Angela, Francois Vurpillot, BREVET INTERNATIONAL n WO/2010/000574 Application number int:...