3. Instrumentation
While the principle of near-field optical microscopes is simple, many technical problems need to be solved before the principle can be put into practice. Let's take a quick look at them, and at the solutions that have been proposed to solve them. Let's start with the technical problems common to all near-field microscopes.
3.1 Scanning device
Like all local probe microscopes, near-field optical microscopes use piezoelectric ceramics to position and move the tip in all three spatial dimensions. These devices are sold complete with control electronics. Given current optical resolutions, a resolution of 1 nm in ( x, y) seems sufficient. A resolution of 0.1 nm is required in z . The quality of the scanning device depends on the quality of the ceramics (linearity...
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Instrumentation
Results and applications
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"Mechanical and dimensional measurements"
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In Engineering Techniques
- (1) - SALVAN (F.) - Microscopie par effet tunnel - . Techniques de l'Ingénieur, P 895, vol. P1 (1989).
- (2) - ARNOLD (M.) - Microscopie optique - . Tech-niques de l'Ingénieur, P 860, vol. P1 (1993).
References
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