Sensor integration in a scanning microscope
Scanning nitrogen vacancy center magnetometry and its applications in nanomagnetism
Article REF: R6803 V1
Sensor integration in a scanning microscope
Scanning nitrogen vacancy center magnetometry and its applications in nanomagnetism

Author : Aurore FINCO

Publication date: October 10, 2024 | Lire en français

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3. Sensor integration in a scanning microscope

As mentioned at the beginning of this article, in § 1.1.3 , the principle of scanning NV microscopy is to integrate the NV center at the end of a tip for local probe microscopy. This takes advantage of the NV center's excellent magnetic sensitivity and versatility, while benefiting from the nanometric...

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