1. Design techniques to increase circuit testability
This section presents the basic techniques for improving the testability of a circuit to facilitate off-line testing, although on-line testing can also rely on these techniques. Depending on the design constraints of a given circuit, the different approaches cited below can be combined to give a considerable number of variants, detailed in the literature
Exclusive to subscribers. 97% yet to be discovered!
Already subscribed? Log in!
Design techniques to increase circuit testability
IEEE 1149.1 boundary scan standard
Bibliography
Exclusive to subscribers. 97% yet to be discovered!
Already subscribed? Log in!
Article included in this offer
"Electronics"
(
268 articles
)
Updated and enriched with articles validated by our scientific committees
A set of exclusive tools to complement the resources
