Test of integrated digital circuits - Design For Testability : Architectures and methods for testing complex systems

Architectures and methods for testing complex systems
Test of integrated digital circuits - Design For Testability

Authors : Mounir BENABDENBI, Régis LEVEUGLE

Publication date: May 10, 2022 | Lire en français

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4. Architectures and methods for testing complex systems

The evolution of fault models for recent technologies was presented in the article [E 2 460] (§ 5.3

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Architectures and methods for testing complex systems

(1) - AZAIS (F.), BERNARD (S.), FLOTTES (M.L.), GIRARD (P.), LANDRAULT (C.), LATORRE (L.), PRAVOSSOUDOVITCH (S.), RENOVELL (M.), ROUZEYRE (B.) - Test de Circuits et de Systèmes Intégrés. - Éditions Hermes Science, ISBN 2-7462-0864-4 (2004).
(2)...

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