Atomic force microscopy for measuring specific interactions
Functionalize AFM cantilevers and tips with particles to probe interactions with cells

AFM technology, introduced in 1986 , works by controlling the force exerted between a fine tip and a surface while scanning a sample. It relies on physical surface scanning, which distinguishes it from electron and optical microscopy. During scanning, the tip follows the relief of the sample, inducing a deflection of the lever to which it is attached. This deflection is detected by a laser reflected off the back of the lever and...