Availability of nanoscale reference materials
Reference materials for nanometrology - Current situation

The main players in the production of MR(C) dedicated to nanometrology are essentially National Metrology Institutes (NIST (USA), BAM (Germany), DFM (Denmark), NMIJ (Japan), KRISS (South Korea)) or assimilated (JRC-IRMM) and some private companies (ThermoFisher, Polysciences, Whitehouse Scientific, VLSI Standards, etc.). The latter, however, mostly offer second-level reference materials, for example traceable to MRs developed by National Metrology Institutes, and the information provided is unfortunately often incomplete from a metrology point of view (methods used, details of uncertainties, etc.).

Various databases exist to list the MR(C) available,...