Reference materials for nanometrology - Current situation

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Reference materials for nanometrology - Current situation

Author : Nicolas FELTIN

Publication date: September 10, 2025 | Lire en français

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Overview

The development of nanotechnologies and nanomaterials relies on the ability to obtain reliable, accurate and comparable measurements. This data is essential for improving quality control in industrial processes, meeting regulatory requirements and ensuring the safety of nanoproducts placed on the market.
Nanometrology, which encompasses the measurement sciences and techniques used at the nanometer scale, therefore plays a central role in the development of these technologies. Its growth depends in particular on the availability of reference materials and nanostructures that can help ensure reliable and comparable measurements.
This article provides an overview of the reference materials available at the nanoscale and examines the specific needs of two major fields: the nano-object industry, particularly nanoparticles, and nanoelectronics. It focuses in particular on dimensional metrology and the challenges involved in measuring the size of nano-objects and nanostructures. Discover the challenges of measurement at the nanoscale.
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ABSTRACT

The continued development of nanotechnologies and nanomaterials requires reliable and comparable measurement results, so that robust quality control can be put in place to improve industrial production processes, meet regulatory requirements and ensure the safety of nanoproducts on the market.

Nanometrology, the science of measurement on the nanoscale, therefore has a central role to play. Progress in this field will only be possible when the supply of reference nanomaterials and nanostructures is expanded.

This article reviews the reference materials available on the nanometric scale, and also describes the needs in two priority fields: the nano-object industry (e.g. nanoparticles) and nano-electronics. Numerous quantities are concerned, but the needs are primarily concentrated on dimensional metrology.

After an introduction to definitions and the importance of reference materials in metrology, we examine the issues and difficulties involved in measuring the size of nano-objects and nanostructures.

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AUTHOR

  • Nicolas FELTIN : Head of Materials Department - Laboratoire National de Métrologie et d'Essais (LNE), Trappes, France

 INTRODUCTION

The continuing interest in nanomaterials, and the vast range of applications that can be expected from them, can be explained by the strong dependence of the physicochemical properties of objects, whose dimensions range from 1 to 100 nm, on their dimensional characteristics (size and morphology). So, for each desired functional property (electronic, magnetic, optical, thermodynamic, mechanical, etc.) associated with a particular application (all sectors of activity are concerned), it is possible to design a specific nanomaterial. All those involved in this field agree that the development of metrology and instrumentation adapted to the nanometric domain (1 nm–100 nm) would have a "catalytic" effect on the overall development of nanotechnologies.

The entire value chain linked to the production and use of nanomaterials and nanotechnologies is concerned by measurement, from fundamental research to production lines, via the teams involved in studying the impact of these materials on health and the environment. The entire industry needs reliable data, robust and reproducible characterization methods, and confidence in measurement results.

Firstly, measurement plays a crucial role in fundamental research, enabling us to increase our knowledge of nanomaterial properties in order to better understand the correlation between the physicochemical parameters of nano-objects, on the one hand, and the new physical properties that emerge at these nanometric scales, on the other. Secondly, the manufacturers of these nanomaterials are looking for precise tools to better control their manufacturing processes and improve their quality systems. In addition, the transition from laboratory to industrial scale (scale-up) remains a delicate stage in the development of nanomaterials, as synthesis methods are often specific and particular. What's more, it's vital to maintain the precise characteristics of nano-objects developed in the laboratory, so as to preserve their properties at all stages of industrialization. This requires the implementation of measurement methods capable of providing accurate measurements, i.e. measurements that are both precise and faithful (see § 3 ...

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KEYWORDS

thin film   |   metrological traceability   |   calibration   |   nanoparticule   |   Nanometrology   |   certified reference materials   |   ISO/REMCO   |   critical dimensions

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