Nanometrology
Reference materials for nanometrology - Current situation

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Nanometrology
Reference materials for nanometrology - Current situation

Author : Nicolas FELTIN

Publication date: September 10, 2025 | Lire en français

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1. Nanometrology

According to the VIM, metrology is "the science of measurement and its applications, involving both theoretical and practical aspects of measurement" . The metrologist's objective is to ensure confidence in the measurements made, through processes such as uncertainty assessment and calibration of the equipment used, in order to establish metrological traceability of measurement results.

The term "measurement uncertainty" refers...

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