Preamble: dimensional nanometrology
The metrological atomic force microscope
Article REF: NM7050 V1
Preamble: dimensional nanometrology
The metrological atomic force microscope

Authors : Sébastien DUCOURTIEUX, Benoît POYET

Publication date: August 10, 2013 | Lire en français

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3. Preamble: dimensional nanometrology

3.1 Units and SI

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3.1.1 International system of units

Metrology is the science of measurement and its applications. It covers both the theoretical aspects of its description and the practical aspects of its experimental realization, whatever the measurement uncertainty and the field of application.

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