2. Standardized measurement methods

In this section, we review the various existing standards, or those in the process of being standardized, dealing specifically with electromagnetic compatibility measurements on components. These standards are the result of demand from users of integrated circuits (ICs) for reliable, reproducible characterization methods that are inexpensive to implement, enabling them to compare the performance of components from different suppliers, as well as to predict EMC performance at higher levels: printed circuit board, subsystem or even system. IC manufacturers make available to customers the results of EMC measurements using standardized methods. The IEC has five main projects, listed below:

• IEC 61967 : Methods for measuring the emission of components ;

• IEC 62132 : Methods for measuring the susceptibility of components...