Associated protection mechanisms
MOSFET and IGBT : Gate Driver and Semi-conductor Monitoring
Article REF: D3234 V1
Associated protection mechanisms
MOSFET and IGBT : Gate Driver and Semi-conductor Monitoring

Authors : Nicolas Ginot, Christophe Batard, Philippe Lahaye

Publication date: August 10, 2017, Review date: January 29, 2025 | Lire en français

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4. Associated protection mechanisms

4.1 Error handling

Industrial drivers are equipped with fault detection and converter trip systems. When a problem is detected, the power component is protected in two phases. The first is immediate blocking of the power component by the SSD, if this function has been implemented. This action takes place at the driver's secondary stage. At the same time, an error signal in the form of a pulse is sent to the primary stage. Once this signal has been detected, a command to block the power transistor is sent back to the driver's 2 secondary stages, and information is sent to the converter's control system.

To illustrate this, let's take the example of a commonly used structure. The synoptic view of the different parts involved in error handling is illustrated in...

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