Electronic impact source
Noble gases analysis by static mass spectrometry Theory and instrumentation
Article REF: J6636 V1
Electronic impact source
Noble gases analysis by static mass spectrometry Theory and instrumentation

Authors : Laurent ZIMMERMANN, David BEKAERT

Publication date: December 10, 2020 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

1. Electronic impact source

Nier source mass spectrometers, also known as electron impact mass spectrometers, are used to measure the concentrations and isotopic compositions of elements (H 2 , CO 2 , N 2 , noble gases, etc.). They consist of three distinct elements namely, a source to ionize the gases, a magnetic sector to separate the isotopes according to their m/q ratio and several collectors to transform ionic fluxes into measurable electrical currents (figure 1 ).

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Article included in this offer

"Unit operations. Chemical reaction engineering"

( 339 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details
Contact us