Hydrogenated amorphous silicon (SiaH)
Semiconductor resistivity
Article REF: K720 V1
Hydrogenated amorphous silicon (SiaH)
Semiconductor resistivity

Author : André VAPAILLE

Publication date: December 10, 1989 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

4. Hydrogenated amorphous silicon (SiaH)

Amorphous silicon can be easily processed into thin films by depositing it at low temperatures (< 300°C) on a single-crystal or amorphous substrate (e.g. a glass plate) using vacuum evaporation or sputtering. For a long time, this material had no practical application: its resistivity is very high (much higher than that of intrinsic single-crystal silicon, since its mobility band gap is of the order of 1.7 eV), and it was impossible to modulate its resistivity by adding dopant impurities

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Ongoing reading
Hydrogenated amorphous silicon (SiaH)

Article included in this offer

"Characterization and properties of matter"

( 101 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details
Contact us