Glossary
Raman spectroscopy of defects in materials
Article REF: E6322 V1
Glossary
Raman spectroscopy of defects in materials

Authors : Marc D. FONTANA, David CHAPRON, Thomas H. KAUFFMANN, Patrice BOURSON

Publication date: April 10, 2017 | Lire en français

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4. Glossary

CCD (Charge Coupled Device)

CCD (charge-coupled device) sensors are used in most Raman detectors, and refer to a semiconductor architecture that converts a light signal into an electrical signal.

CMOS (Complementary Metal Oxide Semiconductor)

Electronic component manufacturing technology and, by extension, components manufactured using this technology.

EPR (Electronic Paramagnetic Resonance)

A local physical measurement technique that provides quantitative information on the nature of the magnetic species present.

NMR (Nuclear Magnetic Resonance)

Spectroscopy based on the measurement of the absorption of radiofrequency radiation by an atomic nucleus in a strong magnetic field. This technique can be used to determine...

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