4. Application of diffraction

Electron microscopy enables a variety of diffraction modes, not forgetting reflection and backscatter diffraction patterns. These techniques will be discussed in a future issue.

These include area-selective diffraction, microdiffraction and convergent beam techniques (the incident beam has a large aperture, whereas in the previous methods, the incident beam is almost parallel, i.e. hardly convergent).

• The convergent beam method highlights Laue zones, i.e. several successive planes of the reciprocal lattice, providing important information on lattice symmetries and type.

  The simulation in figure 20 , carried out with JEMS, shows the three Laue zones,...