Characterization of defects
Electron Channelling Contrast Imaging Technique (ECCI) and crystalline defects
Article REF: M4145 V1
Characterization of defects
Electron Channelling Contrast Imaging Technique (ECCI) and crystalline defects

Author : Nabila MALOUFI

Publication date: December 10, 2021 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

4. Characterization of defects

4.1 Image of a dislocation (contrast optimization)

Channelling is achieved for a family of hkl planes when the untilted incident beam falls on the edge of the band (hkl), ideally for s > 0 and far from the intersection of another band edge so that only one diffraction condition is satisfied

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?

Article included in this offer

"Studies and properties of metals"

( 160 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details
Contact our team FAQ