2. Wide-angle convergent beam electron diffraction: LACBED

Electron microscopy, based on the diffraction of electrons by matter, is a powerful technique because it provides access to information in both spaces, direct space in image mode and reciprocal or Fourier space in diffraction mode. It also provides other information, in particular the elemental analysis of specimens. Image and diffraction modes are obtained altenatively by varying the feed currents to the projection lenses so that the observation plane is the conjugate of the objective lens image plane, or that of the lens back focal plane where the diffraction pattern is formed. A microscopist's dream would undoubtedly be to access both sets of information simultaneously. The LACBED technique, which is derived from the CBED technique [18] , provides this tremendous opening.