3. Specific issues in trace analysis

3.1 Imaging

Localized analysis of an element and its distribution on the surface of a material is becoming increasingly popular in all fields. This type of analysis (figure 1 ) requires an elemental trace analysis, since depending on the size of the measuring pixel (2D), the element content to be measured can be extremely low. Most of the multi-element techniques mentioned above enable imaging analysis, to which surface analysis techniques can be added. Several fields of application are driving analytical developments