Article | REF: R1394 V1

Atomic force microscopy (AFM)

Authors: Jean-Claude RIVOAL, Christian FRÉTIGNY

Publication date: June 10, 2005 | Lire en français

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    2. Applications

    The ability to study surfaces with extreme resolution using atomic force microscopy techniques has led to the emergence of a wealth of related techniques using locally interacting probes. The world of local detection techniques and AFM-type microscopy is described in figure 18 .

    2.1 Local properties

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    2.1.1 Force measurements

    The ability of the AFM to measure locally weak forces...

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