Article | REF: R1394 V1

Atomic force microscopy (AFM)

Authors: Jean-Claude RIVOAL, Christian FRÉTIGNY

Publication date: June 10, 2005 | Lire en français

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    3. Conclusion

    In this brief exploration of the applications of atomic force microscopy, we have illustrated some of the possibilities offered by this technique, which has been around for less than twenty years. The ability to image surfaces with transverse and vertical resolution in the nanometer range has led to a wealth of original results.

    This technological development has allowed us to get used to the idea that engineering can be carried out on a scale too small to be seen by the naked eye, while using principles (mechanics, electricity, hydraulics, optics, tribology, magnetism...) familiar from the macroscopic world. The fields of application are varied: physics, chemistry, biology, etc. The development of commercial devices continues in parallel with exploratory research to increase acquisition capacity within a given timeframe.

    AFM still has many...

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