6. Glossary

AFM (Atomic Force Microscopy)

Atomic force microscopy is a microscopy technique based on the use of a tip attached to a lever, brought into contact with or at a very short distance (a few nanometers) from the surface to be studied. By controlling the deflection of the lever, topography can be mapped with nanometric spatial resolution.

DFRT (Dual Frequency Resonance Tracking)

The DFRT mode shifts the electrical excitation frequency of the piezoelectric sample so that the distance between the excitation frequency and the system resonance frequency remains constant.

C-AFM (Conductive AFM)

The C-AFM mode measures current by applying a voltage between the AFM tip and the sample. Several measurement ranges are possible, down to values as low as a few tens of femtoamperes....