Article | REF: R1115 V4

Electrical measurement of solid dielectric materials

Author: Alain TOUREILLE

Publication date: July 10, 2019 | Lire en français

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    1. Evolution of dielectric materials

    Since the early 1980s, there has been a clear worldwide drive to advance the characterization of dielectric materials. This trend has gradually taken shape in response to the problems posed by component lifetime. Indeed, the industrial world of electricity and electronics is strongly focused on miniaturization. This must also be achieved by increasing device performance. Mechanical, thermal, electrical and radiative volumetric and surface stresses are constantly on the increase, often leading to shortened lifetimes.

    At the time, dielectric materials were considered the most fragile. In 1985-1987, during international congresses attended by researchers, academics and industrialists, a parameter long suspected – but previously unmeasurable – emerged: space charge. This volumetric or surface charge, due to impurities or structural defects, contributes locally to creating...

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