Characterization of polymers by electron microscopy
Article REF: AM3282 V1

Characterization of polymers by electron microscopy

Author : Christopher John George PLUMMER

Publication date: April 10, 2001 | Lire en français

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 INTRODUCTION

As soon as the first transmission electron microscopes (TEMs) appeared, electron microscopy began to play a key role in the study of the morphology and microdeformation of synthetic polymers. Transmission electron microscopy of polymers is largely based on techniques for observing organic matter developed in the life sciences (biology, medicine), a field in which the majority of microscopists currently work. The specific preparation of samples and the difficulties associated with the damage caused by electron beams characterize it in comparison with other materials (metals, ceramics). In contrast, scanning electron microscopy (SEM) methods are more conventional if, as is often the case, its use is limited to the topographical observation of a surface. However, recent developments such as high-resolution scanning electron microscopy or partial vapour pressure microscopy hold great promise for certain types of polymer-specific studies.

Presented in order :

  • interactions between electron beam and polymer and the resulting damage;

  • the most common sample preparation techniques;

  • specific observation methods.

The purely technical aspects of electron microscopy will not be discussed here, insofar as they are not directly related to synthetic polymers.

Note :

We would like to thank Christelle Grein for proofreading this article.

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