Field-effect evaporation
Atom probe tomography APT
Article REF: P900 V2
Field-effect evaporation
Atom probe tomography APT

Authors : Didier BLAVETTE, François VURPILLOT, Bernard DECONIHOUT

Publication date: December 10, 2013 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

1. Field-effect evaporation

The principle of the tomographic atom probe is based on the ionization and field evaporation of atoms on the surface of a material.

The sample, cut in the form of a fine tip, is raised to a high positive potential V of several kilovolts (figure

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?

Article included in this offer

"Nanosciences and nanotechnologies"

( 135 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details
Contact our team FAQ