A favorable context for the development of nanometrology
The metrological atomic force microscope

Add to my library

NM7050 V1 Article

A favorable context for the development of nanometrology


The metrological atomic force microscope

Authors : Sébastien DUCOURTIEUX, Benoît POYET

Publication date: August 10, 2013 | Lire en français

Add to my library Add to my library

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

2. A favorable context for the development of nanometrology

The current craze for nanomaterials and the vast field of associated applications can be explained by the strong dependence of the physico-chemical properties of nano-objects on their dimensions and morphology. For a particular application, it is thus possible to design a nano-object "à la carte" to meet a specific functional property (electronic, magnetic, optical, thermodynamic, mechanical, etc.). However, these developments face a large number of technological hurdles and specific problems linked to the nanometric dimensions (1-100 nm) of these structures. A common misconception in nanoscience and nanotechnology is that the technological breakthrough faced by industry lies in manufacturing. In reality, in many sectors, the development of ever-smaller devices and materials is the fruit of a long, continuous process resulting from a so-called "top-down" approach to the miniaturization...

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Ongoing reading
A favorable context for the development of nanometrology

Article included in this offer

"Nanosciences and nanotechnologies"

( 137 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details

Contenus associés

Sur le même sujet

Veille personnalisée : Inscrivez-vous !
Contact us