2. Standardized measurement methods
In this section, we review the various existing standards, or those in the process of being standardized, dealing specifically with electromagnetic compatibility measurements on components. These standards are the result of demand from users of integrated circuits (ICs) for reliable, reproducible characterization methods that are inexpensive to implement, enabling them to compare the performance of components from different suppliers, as well as to predict EMC performance at higher levels: printed circuit board, subsystem or even system. IC manufacturers make available to customers the results of EMC measurements using standardized methods. The IEC has five main projects, listed below:
IEC 61967 : Methods for measuring the emission of components ;
IEC 62132 : Methods for measuring the susceptibility of components...
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Standardized measurement methods
Emission modeling
Bibliography
Software tools
INSA Toulouse, October 2011, IC-EMC (version for Windows XP, 7), 135 Av. de Rangueil, 31077 Toulouse, France, software available for free download at http://www.ic-emc.org
Sigrity, Campbell, California, USA, PowerSI software, version 10, 2010 (version for Windows XP), more information at
Websites
IEC (International Electrotechnical Commission) website : http://www.iec.ch
Here you'll find specifications for the various component modeling standards (draft IEC 62433), emission measurement methods (IEC 61967) and immunity (IEC 62132). See details in the "Norms and standards" section below.
ITRS (International...
Events
The international EMC Compo workshop takes place every two years. The workshop was held in November 2015 in Edinburgh. http://www.emccompo.org
Standards and norms
- Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz - IEC 61967 - 2002
- Integrated circuits – Measurement of electromagnetic immunity, 150 kHz to 1 GHz - IEC 62132 - 2006
- EMC IC modelling - IEC 62433 - 2010
- Integrated circuits – Measurement of impulse immunity - IEC 62215 - 2013
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