EMC of Integrated Circuits - Basics

In the development of electronic products and systems, EMC represents a global cost that must be optimized. In the automotive sector, for example, whereas in the 1990s all EMC constraints were reduced to the level of the electronic circuit board, this situation has necessarily evolved in order to distribute EMC constraints and optimize these costs accordingly. The field of EMC has thus been extended and developed to the level of integrated circuits. Being able to characterize their performance was the first step, enabling EMC to become a component selection criterion. The second step was to develop techniques for modeling these components, enabling performance to be predicted at product/system level.

This article, which repeats and updates material published in [E 2 475] , includes a more in-depth look at the concepts of noise sources and their modeling introduced in [E 1 302] . The evolution of manufacturing technologies towards nanometric dimensions is detailed in paragraph 1 from the point of view of various physical and electrical quantities directly related to the electromagnetic compatibility (EMC) of components. In section 2 , we describe the state of the art in standardized measurement methods for components, and propose standards for modeling the emission and immunity of integrated circuits. To illustrate the modeling and simulation aspects, paragraphs