Measurement shunt
Probes for current measurement in power electronics
Article REF: D3085 V1
Measurement shunt
Probes for current measurement in power electronics

Authors : François COSTA, Patrick POULICHET

Publication date: November 10, 2005, Review date: February 25, 2025 | Lire en français

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2. Measurement shunt

The simplest method involves measuring the voltage across a resistor to determine the current flowing through it. This method is inexpensive and provides good accuracy at low frequencies. The measuring resistor and associated circuit must be temperature-stable and accurate, and free from parasitic terms (series inductance, distributed capacitance) and skin effects that degrade high-frequency response. Their main limitations are the absence of insulation, insertion losses when measuring high currents, and limited bandwidth at high frequencies. Various technologies are available, as described below.

2.1 Layered shunt

Thick-film resistors can currently handle power in the order of a hundred watts, with an overall inductance of the order of 10 nH, mainly due to...

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