7. Noise sources in integrated circuits
This chapter, which repeats and updates the information published in
7.1 Technology evolution
The frantic race for integrated circuit performance is reflected in colossal technological efforts to double the performance of integrated circuits every three years, targeting microprocessors and memories in particular, for applications such as communicating objects. Since the 1970s, constant progress in lithographic processes has enabled a reduction in the dimensions...
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Noise sources in integrated circuits
Main interactions of particles with matter
Bibliography
Websites
Ibis Specifications of the different IBIS standards on http://www.eda.org/ibis/home/specs/specs.htm (page consulted on 10/28/10)
IEC specifications for various standards modeling components (IEC 62433 project), emission measurement methods (IEC 61967) and immunity (IEC 62132) on
Standards and norms
International Electrotechnical Commission IEC http://www.iec.ch/
- EMC IC modelling – Part 1: General modelling framework IEC 62 433-1 47A/840/DTS. - IEC 62433 - (2010)
- Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 1: General conditions and definitions IEC 61967-1 - IEC 61967-1 - (2002-03) ...
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